HAST Highly Accelerated Stress Test Chamber

The HAST test chamber is designed to speed up the testing process and shorten the life test of a product or system in a high environment. With the improvement in semiconductor reliability, most of the previous semiconductor devices can withstand the long-term THB test without failure. Therefore, the test time to determine the quality of the finished product also increases accordingly. To improve test efficiency and reduce time, adopt the latest.

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